Government/Defense

FIS hardware thumbnail

Optical Fiber Inspection System

Identifies defects in fiber optic material during manufacturing on a draw tower. This high resolution system uses two line-scan cameras mounted at 90 degrees to each other, each equipped with a microscope objective. High powered LED’s are used to illuminate … More details

Thin Film Defect Detection System

Thin Film Defect Detection

Identifies and quantifies defects in thin films. The system utilizes a high-resolution camera, zoom lens, and XYZ motion control, which allows for imaging over an extended area and for auto-focus control. More details

fillstand

Fillstand Control System

Controls the filling and testing of ring laser gyroscopes. Allows for the simultaneous processing of 16 gyros. More details

ASIC config panel

ASIC Test System

A production-class system for functional testing of custom integrated circuits. More details

gyro_test_system

Gyro Test System

System to control the filling and testing of ring laser gyroscopes, using high-speed digital and analog test data. More details

remote_monitoring

Disaster Prevention System

This system measures and logs environmental variables at mission-critical facilities, such as phone switching network sites. If these values fall outside of tolerance at these remote facilities, alarm protocols are instantly and automatically engaged, alerting the appropriate personnel. More details

confidential

Electroplating Control System

Controls the electroplating process for semiconductor materials in a system that is easily expandable to include multiple electroplating tanks using just one computer to control the various electroplating stations. More details

confidential

Mirror Defect Detection System

Quantifies defects on high quality mirrors using laser scattering and high resolution imaging. More details

confidential

Magnetic Field Mapper

Acquires, analyzes, and archives 3-D mappings of magnetic field emanating from large cylindrical magnetic probes using in oil wells. Visualizations of fields can be produced from multiple angles with overlay plots from different runs for comparison. More details