Industrial Control

FIS hardware thumbnail

Optical Fiber Inspection System

Identifies defects in fiber optic material during manufacturing on a draw tower. This high resolution system uses two line-scan cameras mounted at 90 degrees to each other, each equipped with a microscope objective. High powered LED’s are used to illuminate … More details

process-control

Ethylene Oxide Reactor

Compact FieldPoint Real-Time control and monitoring application for an EO pilot plant. More details

Watlow and Eurotherm Systems

Watlow & Eurotherm Reactor Systems

CTI has developed numerous small reactor systems utilizing Watlow and Eurotherm controllers to control temperature, pressure, flow, and other parameters. More details

ArcelorMittal H-HDS 12-apr

Hot Dip Simulator

Controls motion, heating, cooling and logs data from a 1/10th scale simulator of steel manufacturing facility. Uses PID control to optimize heating and cooling of steel panels. More details

Thin Film Defect Detection System

Thin Film Defect Detection

Identifies and quantifies defects in thin films. The system utilizes a high-resolution camera, zoom lens, and XYZ motion control, which allows for imaging over an extended area and for auto-focus control. More details

Automotive Injection

Automotive Test System

A test system which reads and logs data from an automotive computer. More details

Powder Hopper

Powder Feed Control System

Controls the powder dispensing rate, heater temperature, and other functions of one or two powder feed controllers. More details

confidential

Electrotechnology Laboratory Monitor

Allows for the simultaneous monitoring and logging of data from 5 test stations distributed throughout a laboratory. More details

confidential

HFC Refrigerants Reactor

CTI has developed multiple custom software applications to control and monitor HFC refrigerant reactor pilot plants. These high channel count systems employ NI cFP Real-Time hardware for the highest level of reliability. More details

confidential

Electroplating Control System

Controls the electroplating process for semiconductor materials in a system that is easily expandable to include multiple electroplating tanks using just one computer to control the various electroplating stations. More details